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NX4881A
4881HV High Voltage Wafer Test System 
入門價  
最大 SPGU 輸出通道數: N/A
最大量測針腳數: 29
最小電流量測解析度: 10 fA
最小電壓量測解析度: 2 µV
Parallel Parametric Test Capability: 否
P9001A
P9001A 大規模並聯參數測試系統 
入門價  
最大 SPGU 輸出通道數: N/A
最大量測針腳數: 100
最小電流量測解析度: 0.1 fA
最小電壓量測解析度: 2 µV
Parallel Parametric Test Capability: 是
P9002A
P9002A 並聯參數測試系統 
入門價  
最大 SPGU 輸出通道數: 4 channels
最大量測針腳數: 100
最小電流量測解析度: 0.1 fA
最小電壓量測解析度: 2 µV
Parallel Parametric Test Capability: 是
NX5402A
NX5402A Silicon Photonics Wafer Test System 
入門價  
最大 SPGU 輸出通道數: N/A
最大量測針腳數: 12 (optical in), 12 (optical out), 30 (electrical)
最小電流量測解析度: N/A
最小電壓量測解析度: N/A
Parallel Parametric Test Capability: 否
NX5730A
NX5730A 高速率 1 ns 脈衝 IV 記憶體測試解決方案 
入門價  
最大 SPGU 輸出通道數: N/A
最大量測針腳數: 2
最小電流量測解析度: 1 pA
最小電壓量測解析度: N/A
Parallel Parametric Test Capability: 否
N9100A
4080 系列參數測試系統 
入門價  
最大 SPGU 輸出通道數: N/A
最大量測針腳數: 48
最小電流量測解析度: 1 fA
最小電壓量測解析度: 2 µV
Parallel Parametric Test Capability: 否
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