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相關內容
Highlights
- One-stop integrated solution with optical/electrical test capabilities for fully-automated wafer prober
- Automated one pass testing for complex and massive optical and electrical measurements
- Volume production-ready with SECS/GEM Factory Automation, safety interlock, and clean room-ready features
- High throughput testing by optimized fiber alignment and multi-channel optical/electrical test architecture
- Guaranteed system performance by Keysight's Advanced Wafer-Level Photonic Calibration
- Dedicated support model enabling high system availability for production
- Keysight-developed Fiber Alignment and Positioning System
- Leading-edge PathWave Semiconductor Test software integrating Keysight SPECS
- Reliable performance monitoring by Build-in Automatic System Diagnostics
- Automated Multi-Recipe Execution software enabling multiple recipes to run in batch mode
主要技術規格
最大 SPGU 輸出通道數
N/A
最大量測針腳數
12 (optical in), 12 (optical out), 30 (electrical)
最小電流量測解析度
N/A
最小電壓量測解析度
N/A
Parallel Parametric Test Capability
否
最大 SPGU 輸出通道數
最大量測針腳數
最小電流量測解析度
最小電壓量測解析度
Parallel Parametric Test Capability
N/A
12 (optical in), 12 (optical out), 30 (electrical)
N/A
N/A
否
查看更多
附加功能:
One-pass optical & electrical test
Form Factor:
N/A
最大量測針腳數:
12 (optical in), 12 (optical out), 30 (electrical)
最大 SPGU 輸出通道數:
N/A
最小電流量測解析度:
N/A
最小電壓量測解析度:
N/A
Parallel Parametric Test Capability:
否
類型:
Silicon Photonics Wafer Test Solution
Extend the capabilities for your Silicon Photonics Wafer Test System
Featured Resources for the Silicon Photonics Wafer Test System
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