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為您介紹我們最新的經濟型數位 Medalist i1000D 在線測試系統

Medalist i1000D 已經支援了覆蓋擴展技術（CET）。其僅需要一 VTEP MUX 卡即可啟動 CET。如果您已經以 VTEP MUX 卡使用測試夾具，現在起可以不須任何的測試夾具修改就能夠實現 CET。只要加入先前無法測試的新 VTEP 探棒到裝置上即可。如此可大幅降低部署工作所需的心力。

此外，現在還有混合信號測試模式可選用。進行數位到類比以及類比到數位的測試策略，都已經涵蓋在 i1000D 的功能內。這類混合型測試將類比及數位測試信號源結合成單一檔案，可以讓您輕鬆地同時查看兩測試信號源。

藉由其每針腳均可程控的獨特功能，i1000D 支援了一項新的針腳驅動測試模式以增加其自身的靈活性。您可以選擇控制測試儀上的任何數位資源，來停用或預先處理接腳。簡而言之，針腳驅動測試模式能夠讓您完全控制測試儀上的可用數位驅動程式，而無須數位測試程式庫。

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U9401B
U9401B Medalist i1000D 
入門價  
The U9401B Medalist i1000D ICT system offers per pin programmable digital cards to support boundary scan, serial programming, and VCL/PCF digital testing.
U9405A
U9405A Medalist i1000D 輕巧型（SFP）線上與線下在線系統 
入門價  
U9405A i1000D SFP is the smallest inline automated ICT in the world with the most powerful digital test capabilities. It is the only ICT platform that can be switched between inline and offline configuration.
U9405B
U9405B Keysight Flexicore i1000 自動化內嵌平行在線測試系統 
入門價  
Enhanced Flexicore i1000 ICT system with parallel test features, taking advantage of multi-core processing capabilities.
U9403A
U9403A 小型內電路測試系統 
入門價  
The U9403A Mini ICT provides full ICT features like VTEP, Boundary Scan, and DUT power control which maximize your test coverage by combining functional tests.
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在線測試 > Keysight Medalist i1000的精選資源

White Papers 2015.06.07

A Bead Probe CAD Strategy for In-Circuit Test

A Bead Probe CAD Strategy for In-Circuit Test

Explore a bead probe CAD strategy for in-circuit test. Learn how to use bead probes in computer aided design (CAD) systems for production.

2015.06.07

Application Notes 2014.07.30

Using the Graphical Pin Locator on Medalist ICT Systems

Using the Graphical Pin Locator on Medalist ICT Systems

The graphical locator tool on the Keysight Medalist In-Circuit Test (ICT) System is an improvement over the old “Find Pins” tool. Give it a try!

2014.07.30

Data Sheets 2024.11.20

U9401B

U9401B

This datasheet provides detailed insights into the Keysight U9401B Medalist i1000D In-Circuit Tester (ICT), a versatile solution that combines advanced digital testing capabilities with user-friendly graphical interfaces. It highlights key features, including per-pin programmable digital cards, Boundary scanning, and I2C/SPI serial programming, all designed to deliver cost-effective and comprehensive test coverage for both digital and analog components.

2024.11.20

Application Notes 2014.07.30

Using the Auto Optimizer on the Medalist ICT Systems

Using the Auto Optimizer on the Medalist ICT Systems

Auto Optimizer is a tool designed to evaluate and fine-tune analog in-circuit tests automatically to improve throughput for ICT systems.

2014.07.30

Flyers 2014.07.30

Medalist VTEP v2.0 Powered!

Medalist VTEP v2.0 Powered!

Keysight Medalist VTEP v2.0 Powered! is a comprehensive suite of test tools designed to tackle today’s test challenges. Technological advances are putting tremendous pressures on manufacturing test. Nearly every segment of the electronics industry is affected by these trends.

2014.07.30

Article Reprints 2014.07.30

A New Equilibrium

A New Equilibrium

The EMS and ODM markets are moving to a new equilibrium as they continue to balance cost pressures and technology evolution. This article looks at the trends shaping this new balance.

2014.07.30

White Papers 2024.01.17

The Future of In-Circuit Testing in the High-Speed, Complex Electronics Environment

The Future of In-Circuit Testing in the High-Speed, Complex Electronics Environment

In high-speed, complex, electronics environments, the future of ICT solutions must overcome a multitude of issues.

2024.01.17

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