DDR Memory Test Challenges from DDR3 to DDR4 and DDR5
白皮書
DDR memory chip technology progressed through 2 generations in the past 10 years and the next generation is currently being defined. As each of these generations has improved to allow more data to be transferred at faster rates, margins decrease and therefore design work and testing become more challenging. This whitepaper will discuss the progession of the technology, how tests have had to evolve accordingly, the test equipment that can help combat challenges presented by current and future generations of DDR.